My Background
Filter Experience, Skills and Projects
Experience
IBM
Research Intern
May 2010 - August 2010
- Developed programs in HTBasic to control wafer probe to conduct test on dielectric builds.
- Analyzed data collected from series of IV tests done on dielectric builds.
- Presented findings and results at company poster session.
Education
Projects
Characterization of Dielectrics in Builds and Enhance our Understanding of TDDB (IBM Research Project)
IBM
Current methods of testing newly developed dielectrics can prove time consuming. The project was aimed towards exploring alternates to the current process of testing dielectrics. This was done by conducting a series of IV test using a wafer prober on multiple dielectric builds. During which, interesting behaviour noticed lead to further research to understand time dependent dielectric break down. This involved the design of new tests and development of new programs to control the wafer prober. The results were then analysed.