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Data Analysis
Dielectric Testing
HTBasic
Programming
Software Design & Development
Microcontrollers
Leadership
Circuit Design
Embedded Systems
Bench Testing
Experience
IBM

Research Intern

May 2010 - August 2010

  • Developed programs in HTBasic to control wafer probe to conduct test on dielectric builds.
  • Analyzed data collected from series of IV tests done on dielectric builds.
  • Presented findings and results at company poster session.
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